Identification of unknown components on surfaces (interfaces, multilayers), or isolated / single samples in case of process contamination, residues or foreign substances.
- Direct chemical identification on surfaces/interfaces
- Depth profile(s) with structure and dimension information (e.g. multilayer)
- Structure elucidation of chemical components (IR spectroscopic, IR database searches)
Quantifications via IR spectroscopy (organic/inorganic substances)
Measurement of indoor air contamination (e.g. silicones, greases, oils) in the trace range in production facilities (electronic manufacturing, high-tech research facilities) with "specular reflectance" measurement technology.
General analytical problems or questions from the QC laboratory, process monitoring (on/off-line) and the research laboratory.
If other analytical techniques are required (chromatography coupled techniques such as LC/GC-MS or classical analytical methods), these methods are available via cooperation partners.