TM4000 III Brochure

Reduce your workload and achieve more consistent results.

• More automation with macro options for stage movement, magnification settings and image capture.
• Mode 5, the new high-current setting with improved signal for imaging and EDX analysis of particles.

Plan ahead

• The TM4000III is equipped with a system that allows you to monitor the remaining lifetime of the filament, preventing it from failing when it is needed most, e.g. EDX mapping experiments.

More routine with less time required

• The new functions help you to improve and standardise your quality control.

Specifications

• compact tabletop microscope (W x H x D: 330 mm x 617 mm x 547 mm), without additional infrastructure operational directly on your lab table
• magnification 10x up to 100'000x (250'000x monitor)
• acceleration voltage 5 kV, 10kV, 15 kV and 20kV
• large depth of focus due to electron beam optics
• very simple operation – everybody can use it
• optional motorized x.y stage, optical camera for sample navigation
• element contrast with backscattered detector BSE (BSE and UVD detector secondary electron images SE) as well as BSE/SE mix
• various imaging modes to highlight topology or element contrast
• stitching of SEM images possible (multi ZigZag function)
• electronic image optimization for better focus and more contrast
• report creatir for individual design
• two vacuum modes for charge-up reduction (measurement of non-conductive samples without coating)
• Automation via macro options for stage movement, magnification settings and image capture
• Support for stable device operation by displaying the filament indicator
• upgradable with EDS detectors (see below)